Dataset
SAIT_semiconductors_ACS_2023_HfO_test
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| Name | SAIT_semiconductors_ACS_2023_HfO_test |
|---|---|
| Extended ID | SAIT_semiconductors_ACS_2023_HfO_test__Kim-Na-Kim-Cho-Kang-Lee-Choi-Kim-Lee-Kim__DS_dxzkbbocjb0y_0 |
| Description | Test configurations from the SAIT_semiconductors_ACS_2023_HfO dataset. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects. |
| Authors |
Geonu Kim Byunggook Na Gunhee Kim Hyuntae Cho Seung-Jin Kang Hee Sun Lee Saerom Choi Heejae Kim Seungwon Lee Yongdeok Kim |
| DOI |
10.60732/e7100354
https://commons.datacite.org/doi.org/10.60732/e7100354 https://doi.datacite.org/dois/10.60732%2Fe7100354 https://doi.org/10.60732/e7100354 Cite as: Kim, G., Na, B., Kim, G., Cho, H., Kang, S., Lee, H. S., Choi, S., Kim, H., Lee, S., and Kim, Y. "SAIT semiconductors ACS 2023 HfO test." ColabFit, 2024. https://doi.org/10.60732/e7100354. For other citation formats, see the DataCite Fabrica page for this dataset. |
| Calculated Property Types |
atomic_forces cauchy_stress energy |
| Elements |
Hf (33.33%) O (66.67%) |
| Number of Configurations | 3,510 |
| Number of Atoms | 336,960 |
| Links |
https://github.com/SAITPublic/MLFF-Framework https://openreview.net/forum?id=hr9Bd1A9Un |
| Configuration Sets by Name | (None) |
| Configuration Sets by ID | (None) |
| Calculated Properties | |
| ColabFit ID | DS_dxzkbbocjb0y_0 |
| Files | colabfitspec.json |
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