Dataset
SAIT_semiconductors_ACS_2023_SiN_test
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| Name | SAIT_semiconductors_ACS_2023_SiN_test |
|---|---|
| Extended ID | SAIT_semiconductors_ACS_2023_SiN_test__Kim-Na-Kim-Cho-Kang-Lee-Choi-Kim-Lee-Kim__DS_orfjpdomkekx_0 |
| Description | Test configurations from the SAIT_semiconductors_ACS_2023_SiN dataset. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects. |
| Authors |
Geonu Kim Byunggook Na Gunhee Kim Hyuntae Cho Seung-Jin Kang Hee Sun Lee Saerom Choi Heejae Kim Seungwon Lee Yongdeok Kim |
| DOI |
10.60732/821cd3a8
https://commons.datacite.org/doi.org/10.60732/821cd3a8 https://doi.datacite.org/dois/10.60732%2F821cd3a8 https://doi.org/10.60732/821cd3a8 Cite as: Kim, G., Na, B., Kim, G., Cho, H., Kang, S., Lee, H. S., Choi, S., Kim, H., Lee, S., and Kim, Y. "SAIT semiconductors ACS 2023 SiN test." ColabFit, 2024. https://doi.org/10.60732/821cd3a8. For other citation formats, see the DataCite Fabrica page for this dataset. |
| Calculated Property Types |
atomic_forces cauchy_stress energy |
| Elements |
N (50.55%)
Si (49.45%) |
| Number of Configurations | 2,866 |
| Number of Atoms | 165,559 |
| Publication Link | https://openreview.net/forum?id=hr9Bd1A9Un |
| Data Source Link | https://github.com/SAITPublic/MLFF-Framework |
| Configuration Sets by Name | |
| Configuration Sets by ID | |
| ColabFit ID | DS_orfjpdomkekx_0 |
| Downloads | 5 |
| Files | colabfitspec.json |
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